System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
-
product
Stress Relaxation Testing Machine
JINAN PRCISION TESTING EQUIPMENT CO., LTD
Model SXW Series Computer Control Electronic Relaxation Testing Machine is designed for the relaxation tests of steel wires, indented wire, and galvanized steel wire etc. This machine adopts vertical load frame with great rigidity, AC servomotor with zero clearance & great torque precise reducer to drive the screw to carry out the adjustment of the test space. the tension of specimen and keeping of the load force. to complete the relaxation test. the machine is equipped with especially desig...show more -
product
Data Acquisition System
DDX100
The DDX100 SmartCorder® is an all new portable data acquisition system that includes everything you need to record, review and analyze data in one piece of test equipment. Its compact size, lightweight design and battery operation make it a very convenient system for use in industrial environments, test labs, and in vehicle testing or field service applications.
-
product
Battery Test Systems
NH Research (NHR) is a leading manufacturer of battery test equipment and system solutions for all battery chemistries, fuel-cells, super capacitors, and energy storage systems. NHR’s battery test equipment includes the 9300 High Voltage Battery Test System and 9200 Battery Test System which provides the flexibility to address today’s higher voltage levels, and modularity to expand for future requirements.
-
product
Reporting Tool for Dynamic Signal Analyzer
m+p eReporter
m+p eReporter is the powerful reporting tool of the m+p Analyzer dynamic signal analyzer. It provides test engineers with comprehensive capabilities for browsing and viewing data, copying & pasting data to ActiveX applications, importing test data from many third-party noise & vibration systems and automating repetitive tasks. This full functionality is available without any measurement hardware connected.
-
product
Test Systems
This measurement system is the state-of-the-art acoustical analyser from Norsonic. Using the experiences and accumulated know-how from the previous generations of analysers, Norsonic is offering a multi-channel system with focus on user friendliness, high efficiency, and accurate reporting. The system has been designed for field testing as well as demanding accredited lab measurements.
-
product
USB
The introduction of USB 3.2 and USB4 along with the Type-C connector ushers in a new era of unprecedented performance for consumer electronics that can now utilize this universal interface for power, data and display. Positioned as the primary high-performance interconnect for the next decade, developers are ramping up their USB3.2 / USB4 expertise. From engineering validation to compliance test, trust the experts at Teledyne LeCroy to help ensure product compatibility for next generation USB systems.
-
product
Optical Test Instruments
OptiSpheric® & Spherometer
TRIOPTICS' OptiSpheric® and Spherometer are the classic optical test systems for spherical lenses that can be found in virtually any optical manufacturing process. While the Spherometer is used for the tactile determination of lens radii, OptiSpheric® systems provide contactless measurement of effective focal length, back focal length, flange focal length, MTF on axis and the radius of lenses. Specific upgrades allow determining centration errors and angles on plane surfaces. Systems for testing...show more -
product
Linear DC Power Supply
MPS-5 Series
The five-channel programmable DC power supply is a new generation of high quality programmable linear DC power supply. The five channels can independently adjust the voltage and current. This series of products are equipped with RS232 communication interface, which has both desktop and system characteristics, and can be arbitrarily matched with other instruments, integrated as a test system with special functions to complete the measurement requirements in different occasions. The Upper computer...show more -
product
Programmable DC Power Supply
62000L Series
The Chroma 62000L Series Programmable DC power supplies have low noise linear performance and fast transient response. The units have many unique functions that are targeted for overall automated test system integration, automotive power electronics MCU/ECU, power semiconductors, wireless communications, etc. The 62000L Series is a high quality yet cost effective programmable DC Source, designed to meet the stringent requirements of the next generation of power electronics. The GPIB and USB cont...show more -
product
Test Systems
Ball Systems delivers best-in-class automated testing systems, software programming, integrated manufacturing systems, and industrial engineered solutions. Our team has former corporate test engineers, quality assurance engineers, industrial engineers, and test managers who have decades of experience to assist customers in meeting their automated test challenges by offering:
-
product
Mini Rack 60*60*60cm
OTP2 module no.001
The rack serves as the basic structure for your individually designed test system. Various OTP² modules can be installed in the 60 x 60 x 60 cm rack in order to implement a wide variety of test requirements.
-
product
OSFP 800G
OSFP800 has emerged as a leading standard to drive the development of 800G ecosystem. The MultiLane OSFP800 development kit is an essential tool to ensure the validity of your OSFP800 products. The module compliance board (MCB) is used to test transceivers, AOCs, active cables and DACs, while the host compliance board (HCB) enables the testing of system host ports. The loopback modules (LB) provide an economical way to test thermal capacity and signal integrity of system host ports at every stage of the process: R&D validation, production testing, and field testing.
-
product
HALT Test Service
HALT, Highly Accelerated Life Test is a system design validation tool for maximum robustness verification. In a step stress approach a system under functional test and operational conditions is check for functional and destruct limits.
-
product
Test Cells
Our test cells are built using a modular system. This means that the usable space size and shape can be specifically adapted to the required conditions.
-
product
Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
-
product
Prototype Engineering Test
PET-2/PET-3
Exatron's Prototype Engineering Test (PET) Fixture is a semi-automated solution that bridges the gap between a fully automated handling system and a low cost, lower volume handler.
-
product
Field Test Set
MTS-207
The MTS-207 is a state-of-the-art portable PXI platform for field testing and data acquisition systems. Its proven architecture has been deployed worldwide on multiple programs including the MTS-206 Maverick Missile system flight line tester. The MTS-209 Common Armament Test Set, the AN/TSM-205B Hellfire System test Set, and many more. It combines the capabilities of the versatile and powerful PXI architecture in a compact, ultra-rugged, flight-line qualified enclosure. The MTS-207 is ideal for test and data acquisition applications requiring operation under harsh environmental conditions including flight-line, back-shop, or airborne applications.
-
product
Semiconductor
DieMark
DieMark Inking Systems are available in Electric and Pneumatic models and utilize convenient, disposable DieMark Ink Cartridges to streamline and optimize the process of marking defective die. With models available for nearly every test platform and configuration, Xandex inking systems are in operation daily in every corner of the world where wafer sort is performed.
-
product
IQC Test Systems
Signalysis has worked with many Tier I and Tier II Automotive sub-suppliers to provide production test systems. Below are some examples of our systems; we have also supplied systems for wiper motors, axles, door panels, window mechanisms, and many other interior components.
-
product
Seno-Con Test System
PANTHER 2K QST
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
-
product
Battery Module/Battery Pack Test
The battery test system CT3001B and CT3001D provide solutions for battery module/battery pack test with higher current/voltage. They can also be used in situations that batteries are charged/discharged at high rates. Different current/voltage range and channels numbers can be custom made based on the requirement.
-
product
System for Analysis and Jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32G) Fibre Channel
SierraNet M328Q
The SierraNet M328Q™ system provides for analysis and jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32G) Fibre Channel data capture and protocol verification for developers & protocol test engineers in LAN, SAN, NAS and other Ethernet and Fibre Channel applications. Available with two QSFP28 FlexPorts™ for maximum configuration and utility, the SierraNet M328Q includes an easy to use, customizable software interface, large capture buffers, and the most advanced capture, triggering, impairment and filtering capabilities in the industry.
-
product
RF Bias Burn-In System
These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
-
product
In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
-
product
Systems Integration
We supply a full range of system integration services to ensure system success. Our services include system hardware build, integration of modular instrumentation including PXI, test fixture development, system wiring, software development, factory and site acceptance testing and data analytics.
-
product
Conformance Testing
Clarinet-TTCN ATM ETS
Protocol: UNI 3.1 ATM Layer Conformance Test Suite for End SystemsIUT: ATM Equipment UNI 3.0ATS: ATM-FORUM standards af-test-0060.000 covers the test of UNI 3.0 ATM Layer of End Systems
-
product
XRF
O Series
The O Series combines high performance with a small x-ray spot size. This is made possible by the poly-capillary focusing optics system that replaces the collimator assembly installed in standard Bowman systems. The optics are designed to focus the x-rays coming from the tube exit window to a very small spot size (80μm FWHM) while retaining virtually 100% of the tube flux. So instead of attenuating the x-rays that can’t fit through the small apertures, as is the case with collimator systems, the...show more -
product
Test System Mainframe
ITC59000
The ITC59000 Test Platform is a desktop DynamicParametric Test System mainframe. The ITC59000Test Platform accepts up to four Test MeasurementUnits (TMUs) that perform transient measurements onsemiconductor devices such as power MOSFETs,IGBTs, and diodes.
-
product
Exchangeable Test Fixture
2112/D/H/S-7/HG/Pylon
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 13,50 kg
-
product
EXG X-Series Microwave Analog Signal Generator, 9 kHz to 40 GHz
N5173B
Balance budget & performance to address parametric testing of microwave components & receiversPerform LO up conversion for microwave backhaul links or CW blocking for receiver testingMaximize test throughput with 600-s frequency switchingCharacterize microwave filters & amplifiers with the best combination of output power, low harmonics & full step attenuationUse as a high-stability system reference: the standard high-performance OCXO has an aging rate of 5x10-10 parts/day
